Lee, S., Nathan, A., Jeon, S., & Robertson, J. (2015). Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy. Sci Rep.
Style de citation ChicagoLee, Sungsik, Arokia Nathan, Sanghun Jeon, et John Robertson. "Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed By Gate Pulse Spectroscopy." Sci Rep 2015.
Style de citation MLALee, Sungsik, Arokia Nathan, Sanghun Jeon, et John Robertson. "Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed By Gate Pulse Spectroscopy." Sci Rep 2015.
Attention : ces citations peuvent ne pas être correctes à 100%.