Jana, D., Chakrabarti, S., Rahaman, S. Z., & Maikap, S. (2015). Resistive and New Optical Switching Memory Characteristics Using Thermally Grown Ge(0.2)Se(0.8) Film in Cu/GeSe(x)/W Structure. Nanoscale Res Lett.
Citación estilo ChicagoJana, Debanjan, Somsubhra Chakrabarti, Sheikh Ziaur Rahaman, and Siddheswar Maikap. "Resistive and New Optical Switching Memory Characteristics Using Thermally Grown Ge(0.2)Se(0.8) Film in Cu/GeSe(x)/W Structure." Nanoscale Res Lett 2015.
Cita MLAJana, Debanjan, Somsubhra Chakrabarti, Sheikh Ziaur Rahaman, and Siddheswar Maikap. "Resistive and New Optical Switching Memory Characteristics Using Thermally Grown Ge(0.2)Se(0.8) Film in Cu/GeSe(x)/W Structure." Nanoscale Res Lett 2015.
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