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Polarization Properties in Apertureless-Type Scanning Near-Field Optical Microscopy

Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM wor...

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Detalhes bibliográficos
Publicado no:Nanoscale Res Lett
Main Authors: Ishibashi, Takayuki, Cai, Yongfu
Formato: Artigo
Idioma:Inglês
Publicado em: Springer US 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4586183/
https://ncbi.nlm.nih.gov/pubmed/26415540
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-1062-5
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