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Validation of whole slide imaging for frozen section diagnosis in surgical pathology
BACKGROUND: Whole slide imaging (WSI) using high-resolution scanners is gaining acceptance as a platform for consultation as well as for frozen section (FS) evaluation in surgical pathology. We report results of an intra-observer concordance study comparing evaluation of WSI of scanned FS microscope...
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| 出版年: | J Pathol Inform |
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| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Medknow Publications & Media Pvt Ltd
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4584446/ https://ncbi.nlm.nih.gov/pubmed/26430537 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.4103/2153-3539.163988 |
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