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MoS(2) Heterojunctions by Thickness Modulation
In this work, we report lateral heterojunction formation in as-exfoliated MoS(2) flakes by thickness modulation. Kelvin probe force microscopy is used to map the surface potential at the monolayer-multilayer heterojunction, and consequently the conduction band offset is extracted. Scanning photocurr...
Enregistré dans:
| Publié dans: | Sci Rep |
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| Auteurs principaux: | , , , , , , , , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Nature Publishing Group
2015
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4485222/ https://ncbi.nlm.nih.gov/pubmed/26121940 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10990 |
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