Ping Wang, Y., Letoublon, A., Nguyen Thanh, T., Bahri, M., Largeau, L., Patriarche, G., . . . Durand, O. (2015). Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III–V photonics platform on silicon using a laboratory X-ray diffraction setup. J Appl Crystallogr.
Citação norma ChicagoPing Wang, Yan, et al. "Quantitative Evaluation of Microtwins and Antiphase Defects in GaP/Si Nanolayers for a III–V Photonics Platform On Silicon Using a Laboratory X-ray Diffraction Setup." J Appl Crystallogr 2015.
Citação norma MLAPing Wang, Yan, et al. "Quantitative Evaluation of Microtwins and Antiphase Defects in GaP/Si Nanolayers for a III–V Photonics Platform On Silicon Using a Laboratory X-ray Diffraction Setup." J Appl Crystallogr 2015.