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Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging
Rocking curve imaging (projection and section X-ray topography) has been used to study the generation and propagation of defects at the junctions between and above the seed crystals in mono-like silicon ingots. The images of different kinds of defects such as precipitates, dislocations and twins in...
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| Veröffentlicht in: | J Appl Crystallogr |
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| Hauptverfasser: | , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
International Union of Crystallography
2015
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4453969/ https://ncbi.nlm.nih.gov/pubmed/26089756 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576715004926 |
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