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How little data is enough? Phase-diagram analysis of sparsity-regularized X-ray computed tomography
We introduce phase-diagram analysis, a standard tool in compressed sensing (CS), to the X-ray computed tomography (CT) community as a systematic method for determining how few projections suffice for accurate sparsity-regularized reconstruction. In CS, a phase diagram is a convenient way to study an...
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| Udgivet i: | Philos Trans A Math Phys Eng Sci |
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| Main Authors: | , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
The Royal Society Publishing
2015
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4424483/ https://ncbi.nlm.nih.gov/pubmed/25939620 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1098/rsta.2014.0387 |
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