Growth of an Ultrathin Zirconia Film on Pt(3)Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory

[Image: see text] Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt(3)Zr(0001) substrate by oxidation in 1 × 10(–7) mbar of O(2) at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO(2) films are intended to serve as model supports for reforming catalysts a...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:J Phys Chem C Nanomater Interfaces
Prif Awduron: Li, Hao, Choi, Joong-Il Jake, Mayr-Schmölzer, Wernfried, Weilach, Christian, Rameshan, Christoph, Mittendorfer, Florian, Redinger, Josef, Schmid, Michael, Rupprechter, Günther
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: American Chemical Society 2014
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4321327/
https://ncbi.nlm.nih.gov/pubmed/25688293
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp5100846
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