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Growth of an Ultrathin Zirconia Film on Pt(3)Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory
[Image: see text] Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt(3)Zr(0001) substrate by oxidation in 1 × 10(–7) mbar of O(2) at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO(2) films are intended to serve as model supports for reforming catalysts a...
Gardado en:
| Publicado en: | J Phys Chem C Nanomater Interfaces |
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| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
American Chemical
Society
2014
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| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4321327/ https://ncbi.nlm.nih.gov/pubmed/25688293 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp5100846 |
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