Growth of an Ultrathin Zirconia Film on Pt(3)Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory

[Image: see text] Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt(3)Zr(0001) substrate by oxidation in 1 × 10(–7) mbar of O(2) at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO(2) films are intended to serve as model supports for reforming catalysts a...

Descripción completa

Guardado en:
Detalles Bibliográficos
Publicado en:J Phys Chem C Nanomater Interfaces
Autores principales: Li, Hao, Choi, Joong-Il Jake, Mayr-Schmölzer, Wernfried, Weilach, Christian, Rameshan, Christoph, Mittendorfer, Florian, Redinger, Josef, Schmid, Michael, Rupprechter, Günther
Formato: Artigo
Lenguaje:Inglês
Publicado: American Chemical Society 2014
Acceso en línea:https://ncbi.nlm.nih.gov/pmc/articles/PMC4321327/
https://ncbi.nlm.nih.gov/pubmed/25688293
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp5100846
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares