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Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy
Low dose electron imaging applications such as electron cryo-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on backthinned CMOS sensors. There are currently three commercially ava...
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| Hauptverfasser: | , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Elsevier
2014
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4199116/ https://ncbi.nlm.nih.gov/pubmed/25194828 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2014.08.002 |
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