Analysis of electron beam damage of exfoliated MoS(2) sheets and quantitative HAADF-STEM imaging

In this work we examined MoS(2) sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200 kV. Structural damage of the MoS(2) sheets has been controlled at 80 kV according a theoretical calculation based on the inelastic scattering o...

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Main Authors: Garcia, A., Raya, A.M., Mariscal, M.M., Esparza, R., Herrera, M., Molina, S.I., Scavello, G., Galindo, P.L., Jose-Yacaman, M., Ponce, A.
Format: Artigo
Jezik:Inglês
Izdano: 2014
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Article
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC4169717/
https://ncbi.nlm.nih.gov/pubmed/24929924
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2014.05.004
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