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Localization events-based sample drift correction for localization microscopy with redundant cross-correlation algorithm
Highly accurate sample drift correction is essential in super-resolution localization microscopy to guarantee a high spatial resolution, especially when the technique is used to visualize small cell organelle. Here we present a localization events-based drift correction method using a redundant cros...
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| Asıl Yazarlar: | , , , , , , |
|---|---|
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Optical Society of America
2014
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4162368/ https://ncbi.nlm.nih.gov/pubmed/24977854 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.22.015982 |
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