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Localization events-based sample drift correction for localization microscopy with redundant cross-correlation algorithm

Highly accurate sample drift correction is essential in super-resolution localization microscopy to guarantee a high spatial resolution, especially when the technique is used to visualize small cell organelle. Here we present a localization events-based drift correction method using a redundant cros...

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Detalhes bibliográficos
Main Authors: Wang, Yina, Schnitzbauer, Joerg, Hu, Zhe, Li, Xueming, Cheng, Yifan, Huang, Zhen-Li, Huang, Bo
Formato: Artigo
Idioma:Inglês
Publicado em: Optical Society of America 2014
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4162368/
https://ncbi.nlm.nih.gov/pubmed/24977854
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.22.015982
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