Wong, H., Zhou, J., Zhang, J., Jin, H., Kakushima, K., & Iwai, H. (2014). The interfaces of lanthanum oxide-based subnanometer EOT gate dielectrics. Springer.
Stile di citazione ChicagoWong, Hei, Jian Zhou, Jieqiong Zhang, Hao Jin, Kuniyuki Kakushima, e Hiroshi Iwai. The Interfaces of Lanthanum Oxide-based Subnanometer EOT Gate Dielectrics. Springer, 2014.
Citazione MLAWong, Hei, et al. The Interfaces of Lanthanum Oxide-based Subnanometer EOT Gate Dielectrics. Springer, 2014.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.