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Linear fitting of multi-threshold counting data with a pixel-array detector for spectral X-ray imaging
Experiments and modeling are described to perform spectral fitting of multi-threshold counting measurements on a pixel-array detector. An analytical model was developed for describing the probability density function of detected voltage in X-ray photon-counting arrays, utilizing fractional photon co...
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| Autores principales: | , , , , , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
International Union of Crystallography
2014
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4151684/ https://ncbi.nlm.nih.gov/pubmed/25178010 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514014167 |
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