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On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology
To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These co...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4151678/ https://ncbi.nlm.nih.gov/pubmed/25177985 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514016221 |
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