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Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector
The atomic force microscope (AFM), in addition to providing images on an atomic scale, can be used to measure the forces between surfaces and the AFM probe. The potential uses of mapping the adhesive forces on the surface include a spatial determination of surface energy and a direct identification...
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| 主要な著者: | , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
1994
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4130233/ https://ncbi.nlm.nih.gov/pubmed/25125792 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/la00021a053 |
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