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Processing of X-ray snapshots from crystals in random orientations
A functional expression is introduced that relates scattered X-ray intensities from a still or a rotation snapshot to the corresponding structure-factor amplitudes. The new approach was implemented in the program nXDS for processing monochromatic diffraction images recorded by a multi-segment detect...
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| Autor principal: | |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2014
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4118830/ https://ncbi.nlm.nih.gov/pubmed/25084339 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1399004714013534 |
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