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Abnormal coexistence of unipolar, bipolar, and threshold resistive switching in an Al/NiO/ITO structure
This paper reports an abnormal coexistence of different resistive switching behaviors including unipolar (URS), bipolar (BRS), and threshold switching (TRS) in an Al/NiO/indium tin oxide (ITO) structure fabricated by chemical solution deposition. The switching behaviors have been strongly dependent...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Springer
2014
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4041631/ https://ncbi.nlm.nih.gov/pubmed/24940181 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-9-268 |
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