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Capability of insulator study by photoemission electron microscopy at SPring-8
The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established in an extremely simple way. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft X-rays, and Au films close to the area of interest allow the accu...
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Main Authors: | , , , , , , , , , , , , , |
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Formato: | Artigo |
Idioma: | Inglês |
Publicado em: |
International Union of Crystallography
2013
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Assuntos: | |
Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4032072/ https://ncbi.nlm.nih.gov/pubmed/23765305 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049513012508 |
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