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An infrastructure for accurate characterization of single-event transients in digital circuits()
We present the architecture and a detailed pre-fabrication analysis of a digital measurement ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also demonstrates the suitability of the general approach for obtaining accurate radiation failure models developed i...
में बचाया:
| मुख्य लेखकों: | , , , , , , , , , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
IPC Science and Technology Press]
2013
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3990448/ https://ncbi.nlm.nih.gov/pubmed/24748694 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.micpro.2013.04.011 |
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