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Possibility of graphene growth by close space sublimation
Carbon films on the Si/SiO(2) substrate are fabricated using modified method of close space sublimation at atmospheric pressure. The film properties have been characterized by micro-Raman and X-ray photoelectron spectroscopy and monochromatic ellipsometry methods. Ellipsometrical measurements demons...
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| Главные авторы: | , , , , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Springer
2014
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3989852/ https://ncbi.nlm.nih.gov/pubmed/24731549 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-9-182 |
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