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Particle-guided Image Registration

We present a novel image registration method based on B-spline free-form deformation that simultaneously optimizes particle correspondence and image similarity metrics. Different from previous B-spline based registration methods optimized w.r.t. the control points, the deformation in our method is e...

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Detalhes bibliográficos
Main Authors: Lee, Joohwi, Lyu, Ilwoo, Oğuz, İpek, Styner, Martin A.
Formato: Artigo
Idioma:Inglês
Publicado em: 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3974564/
https://ncbi.nlm.nih.gov/pubmed/24505762
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