Lehmann, D., Seidel, F., & Zahn, D. R. (2014). Thin films with high surface roughness: Thickness and dielectric function analysis using spectroscopic ellipsometry. Springer International Publishing.
Styl ChicagoLehmann, Daniel, Falko Seidel, a Dietrich RT Zahn. Thin Films With High Surface Roughness: Thickness and Dielectric Function Analysis Using Spectroscopic Ellipsometry. Springer International Publishing, 2014.
Citace podle MLALehmann, Daniel, Falko Seidel, a Dietrich RT Zahn. Thin Films With High Surface Roughness: Thickness and Dielectric Function Analysis Using Spectroscopic Ellipsometry. Springer International Publishing, 2014.
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