Lehmann, D., Seidel, F., & Zahn, D. R. (2014). Thin films with high surface roughness: Thickness and dielectric function analysis using spectroscopic ellipsometry. Springer International Publishing.
Citação norma ChicagoLehmann, Daniel, Falko Seidel, and Dietrich RT Zahn. Thin Films With High Surface Roughness: Thickness and Dielectric Function Analysis Using Spectroscopic Ellipsometry. Springer International Publishing, 2014.
MLA CitationLehmann, Daniel, Falko Seidel, and Dietrich RT Zahn. Thin Films With High Surface Roughness: Thickness and Dielectric Function Analysis Using Spectroscopic Ellipsometry. Springer International Publishing, 2014.
Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.