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Tip-enhanced near-field optical microscopy
Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique capable of providing a broad range of spectroscopic information on single objects and structured surfaces at nanometer spatial resolution and with highest detection sensitivity. In this review, we first illustrate the p...
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| Principais autores: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3907270/ https://ncbi.nlm.nih.gov/pubmed/24100541 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1039/c3cs60258c |
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