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Semiparametric Accelerated Failure Time Model for Length-biased Data with Application to Dementia Study

A semiparametric accelerated failure time (AFT) model is proposed to evaluate the effects of risk factors on the unbiased failure times for the target population given the observed length-biased data. The analysis of length-biased data is complicated by informative right censoring due to the biased...

詳細記述

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書誌詳細
主要な著者: Ning, Jing, Qin, Jing, Shen, Yu
フォーマット: Artigo
言語:Inglês
出版事項: 2014
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC3903417/
https://ncbi.nlm.nih.gov/pubmed/24478570
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.5705/ss.2011.197
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