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Semiparametric Accelerated Failure Time Model for Length-biased Data with Application to Dementia Study
A semiparametric accelerated failure time (AFT) model is proposed to evaluate the effects of risk factors on the unbiased failure times for the target population given the observed length-biased data. The analysis of length-biased data is complicated by informative right censoring due to the biased...
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| 主要な著者: | , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2014
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3903417/ https://ncbi.nlm.nih.gov/pubmed/24478570 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.5705/ss.2011.197 |
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