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Semiparametric Accelerated Failure Time Model for Length-biased Data with Application to Dementia Study
A semiparametric accelerated failure time (AFT) model is proposed to evaluate the effects of risk factors on the unbiased failure times for the target population given the observed length-biased data. The analysis of length-biased data is complicated by informative right censoring due to the biased...
Gorde:
| Egile Nagusiak: | , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
2014
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3903417/ https://ncbi.nlm.nih.gov/pubmed/24478570 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.5705/ss.2011.197 |
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