APA ציטוט

Leek, J. T., Scharpf, R. B., Bravo, H. C., Simcha, D., Langmead, B., Johnson, W. E., . . . Irizarry, R. A. (2010). Tackling the widespread and critical impact of batch effects in high-throughput data.

Citação norma Chicago

Leek, Jeffrey T., Robert B. Scharpf, Héctor Corrada Bravo, David Simcha, Benjamin Langmead, W. Evan Johnson, Donald Geman, Keith Baggerly, and Rafael A. Irizarry. Tackling the Widespread and Critical Impact of Batch Effects in High-throughput Data. 2010.

ציטוט MLA

Leek, Jeffrey T., et al. Tackling the Widespread and Critical Impact of Batch Effects in High-throughput Data. 2010.