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Invited Review Article: Methods for imaging weak-phase objects in electron microscopy
Contrast has traditionally been produced in electron-microscopy of weak phase objects by simply defocusing the objective lens. There now is renewed interest, however, in using devices that apply a uniform quarter-wave phase shift to the scattered electrons relative to the unscattered beam, or that g...
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| Formato: | Artigo |
| Idioma: | Inglês |
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AIP Publishing LLC
2013
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| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3855062/ https://ncbi.nlm.nih.gov/pubmed/24289381 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4830355 |
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