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EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the hei...
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| Main Authors: | , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2013
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3842085/ https://ncbi.nlm.nih.gov/pubmed/24284731 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep03352 |
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