Chen, S., McMullan, G., Faruqi, A. R., Murshudov, G. N., Short, J. M., Scheres, S. H., & Henderson, R. (2013). High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy(). Elsevier.

Chen, Shaoxia, Greg McMullan, Abdul R. Faruqi, Garib N. Murshudov, Judith M. Short, Sjors H.W Scheres, και Richard Henderson. High-resolution Noise Substitution to Measure Overfitting and Validate Resolution in 3D Structure Determination By Single Particle Electron Cryomicroscopy(). Elsevier, 2013.

Chen, Shaoxia, et al. High-resolution Noise Substitution to Measure Overfitting and Validate Resolution in 3D Structure Determination By Single Particle Electron Cryomicroscopy(). Elsevier, 2013.