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Measuring long-range carrier diffusion across multiple grains in polycrystalline semiconductors by photoluminescence imaging

Thin-film polycrystalline semiconductors are currently at the forefront of inexpensive large-area solar cell and integrated circuit technologies because of their reduced processing and substrate selection constraints. Understanding the extent to which structural and electronic defects influence carr...

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Bibliografiska uppgifter
Huvudupphovsmän: Alberi, K., Fluegel, B., Moutinho, H., Dhere, R. G., Li, J. V., Mascarenhas, A.
Materialtyp: Artigo
Språk:Inglês
Publicerad: Nature Pub. Group 2013
Ämnen:
Länkar:https://ncbi.nlm.nih.gov/pmc/articles/PMC3826654/
https://ncbi.nlm.nih.gov/pubmed/24158163
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms3699
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