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Measuring long-range carrier diffusion across multiple grains in polycrystalline semiconductors by photoluminescence imaging
Thin-film polycrystalline semiconductors are currently at the forefront of inexpensive large-area solar cell and integrated circuit technologies because of their reduced processing and substrate selection constraints. Understanding the extent to which structural and electronic defects influence carr...
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| Huvudupphovsmän: | , , , , , |
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| Materialtyp: | Artigo |
| Språk: | Inglês |
| Publicerad: |
Nature Pub. Group
2013
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| Ämnen: | |
| Länkar: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3826654/ https://ncbi.nlm.nih.gov/pubmed/24158163 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms3699 |
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