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Disorder strongly enhances Auger recombination in conductive quantum-dot solids
Auger recombination (AR) can be an important loss mechanism for optoelectronic devices, but it is typically not very efficient at low excitation densities. Here we show that in conductive quantum-dot solids, AR is the dominant charge carrier decay path even at excitation densities as low as 10(−3) p...
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| 主要な著者: | , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Pub. Group
2013
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3778520/ https://ncbi.nlm.nih.gov/pubmed/24029819 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms3329 |
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