Bussone, G., Schott, R., Biermanns, A., Davydok, A., Reuter, D., Carbone, G., . . . Pietsch, U. (2013). Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams. International Union of Crystallography.

Bussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck, ja Ullrich Pietsch. Grazing-incidence X-ray Diffraction of Single GaAs Nanowires At Locations Defined By Focused Ion Beams. International Union of Crystallography, 2013.

Bussone, Genziana, et al. Grazing-incidence X-ray Diffraction of Single GaAs Nanowires At Locations Defined By Focused Ion Beams. International Union of Crystallography, 2013.