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A Robust and Efficient Doubly Regularized Metric Learning Approach
A proper distance metric is fundamental in many computer vision and pattern recognition applications such as classification, image retrieval, face recognition and so on. However, it is usually not clear what metric is appropriate for specific applications, therefore it becomes more reliable to learn...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
2012
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3761969/ https://ncbi.nlm.nih.gov/pubmed/24013160 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/978-3-642-33765-9_46 |
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