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Characterization of spatially varying aberrations for wide field-of-view microscopy
We describe a simple and robust approach for characterizing the spatially varying pupil aberrations of microscopy systems. In our demonstration with a standard microscope, we derive the location-dependent pupil transfer functions by first capturing multiple intensity images at different defocus sett...
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| Päätekijät: | , , , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Optical Society of America
2013
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3724395/ https://ncbi.nlm.nih.gov/pubmed/23842300 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.21.015131 |
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