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Dependencies of microstructure and stress on the thickness of GdBa(2)Cu(3)O(7 − δ) thin films fabricated by RF sputtering
GdBa(2)Cu(3)O(7 − δ) (GdBCO) films with different thicknesses from 200 to 2,100 nm are deposited on CeO(2)/yttria-stabilized zirconia (YSZ)/CeO(2)-buffered Ni-W substrates by radio-frequency magnetron sputtering. Both the X-ray diffraction and scanning electron microscopy analyses reveal that the a-...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2013
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3716989/ https://ncbi.nlm.nih.gov/pubmed/23816137 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-304 |
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