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Finite Element Analysis of Electrically Excited Quartz Tuning Fork Devices
Quartz Tuning Fork (QTF)-based Scanning Probe Microscopy (SPM) is an important field of research. A suitable model for the QTF is important to obtain quantitative measurements with these devices. Analytical models have the limitation of being based on the double cantilever configuration. In this pap...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Molecular Diversity Preservation International (MDPI)
2013
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3715236/ https://ncbi.nlm.nih.gov/pubmed/23722828 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s130607156 |
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