Chang, W., & Zorman, C. (2008). Electrical Characterization of Microelectromechanical Silicon Carbide Resonators. Molecular Diversity Preservation International (MDPI).
Styl ChicagoChang, Wen-Teng, a Christian Zorman. Electrical Characterization of Microelectromechanical Silicon Carbide Resonators. Molecular Diversity Preservation International (MDPI), 2008.
Citace podle MLAChang, Wen-Teng, a Christian Zorman. Electrical Characterization of Microelectromechanical Silicon Carbide Resonators. Molecular Diversity Preservation International (MDPI), 2008.
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