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Fluorescent microscopy beyond diffraction limits using speckle illumination and joint support recovery
Structured illumination microscopy (SIM) breaks the optical diffraction limit by illuminating a sample with a series of line-patterned light. Recently, in order to alleviate the requirement of precise knowledge of illumination patterns, structured illumination microscopy techniques using speckle pat...
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| Päätekijät: | , , , , , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Nature Publishing Group
2013
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3691569/ https://ncbi.nlm.nih.gov/pubmed/23797902 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep02075 |
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