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Sub-micron Hard X-ray Fluorescence Imaging of Synthetic Elements
Synchrotron-based X-ray fluorescence microscopy (SXFM) using hard X-rays focused into sub-micron spots is a powerful technique for elemental quantification and mapping, as well as microspectroscopic measurement such as μ-XANES (X-ray absorption near edge structure). We have used SXFM to image and si...
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| Autori principali: | , , , , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
2012
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3688452/ https://ncbi.nlm.nih.gov/pubmed/22444530 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.aca.2012.01.064 |
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