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Digital electron diffraction – seeing the whole picture

The advantages of convergent-beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed by the small Bragg angle for high-energy electron diffraction...

詳細記述

保存先:
書誌詳細
主要な著者: Beanland, Richard, Thomas, Paul J., Woodward, David I., Thomas, Pamela A., Roemer, Rudolf A.
フォーマット: Artigo
言語:Inglês
出版事項: International Union of Crystallography 2013
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC3686228/
https://ncbi.nlm.nih.gov/pubmed/23778099
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0108767313010143
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