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Automated Transmission-Mode Scanning Electron Microscopy (tSEM) for Large Volume Analysis at Nanoscale Resolution

Transmission-mode scanning electron microscopy (tSEM) on a field emission SEM platform was developed for efficient and cost-effective imaging of circuit-scale volumes from brain at nanoscale resolution. Image area was maximized while optimizing the resolution and dynamic range necessary for discrimi...

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Détails bibliographiques
Auteurs principaux: Kuwajima, Masaaki, Mendenhall, John M., Lindsey, Laurence F., Harris, Kristen M.
Format: Artigo
Langue:Inglês
Publié: Public Library of Science 2013
Sujets:
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC3608656/
https://ncbi.nlm.nih.gov/pubmed/23555711
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0059573
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