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Wang, Zhuren, Ying Dou, Samuel J. Goodchild, Zeineb Es-Salah-Lamoureux, and David Fedida. Components of Gating Charge Movement and S4 Voltage-sensor Exposure During Activation of HERG Channels. The Rockefeller University Press, 2013.

Wang, Zhuren, et al. Components of Gating Charge Movement and S4 Voltage-sensor Exposure During Activation of HERG Channels. The Rockefeller University Press, 2013.