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Dot size effects of nanocrystalline germanium on charging dynamics of memory devices

The dot size of nanocrystalline germanium (NC Ge) which impacts on the charging dynamics of memory devices has been theoretically investigated. The calculations demonstrate that the charge stored in the NC Ge layer and the charging current at a given oxide voltage depend on the dot size especially o...

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Autor principal: Mao, Ling-Feng
Format: Artigo
Idioma:Inglês
Publicat: Springer 2013
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC3576263/
https://ncbi.nlm.nih.gov/pubmed/23305228
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-21
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