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Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d(z) at th...
Gorde:
| Egile Nagusiak: | , , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2013
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3566860/ https://ncbi.nlm.nih.gov/pubmed/23400758 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.4.4 |
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