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Performance of a semiconductor SPECT system: comparison with a conventional Anger-type SPECT instrument
OBJECTIVE: The performance of a new single photon emission computed tomography (SPECT) scanner with a cadmium-zinc-telluride (CZT) solid-state semiconductor detector (Discovery NM 530c; D530c) was evaluated and compared to a conventional Anger-type SPECT with a dual-detector camera (Infinia). METHOD...
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| Autores principales: | , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Springer Japan
2012
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3549244/ https://ncbi.nlm.nih.gov/pubmed/22956363 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s12149-012-0653-9 |
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