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Unusual surface and edge morphologies, sp(2) to sp(3) hybridized transformation and electronic damage after Ar(+) ion irradiation of few-layer graphene surfaces
Roughness and defects induced on few-layer graphene (FLG) irradiated by Ar(+) ions at different energies were investigated using X-ray photoemission spectroscopy (XPS) and atomic force microscopy techniques. The results provide direct experimental evidence of ripple formation, sp(2) to sp(3) hybridi...
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| 主要な著者: | , , , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Springer
2012
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3496642/ https://ncbi.nlm.nih.gov/pubmed/22901368 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-466 |
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