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Depth profiling and imaging capabilities of an ultrashort pulse laser ablation time of flight mass spectrometer

An ultrafast laser ablation time-of-flight mass spectrometer (AToF-MS) and associated data acquisition software that permits imaging at micron-scale resolution and sub-micron-scale depth profiling are described. The ion funnel-based source of this instrument can be operated at pressures ranging from...

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Bibliografski detalji
Glavni autori: Cui, Yang, Moore, Jerry F., Milasinovic, Slobodan, Liu, Yaoming, Gordon, Robert J., Hanley, Luke
Format: Artigo
Jezik:Inglês
Izdano: American Institute of Physics 2012
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3461015/
https://ncbi.nlm.nih.gov/pubmed/23020378
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4750974
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