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Depth profiling and imaging capabilities of an ultrashort pulse laser ablation time of flight mass spectrometer
An ultrafast laser ablation time-of-flight mass spectrometer (AToF-MS) and associated data acquisition software that permits imaging at micron-scale resolution and sub-micron-scale depth profiling are described. The ion funnel-based source of this instrument can be operated at pressures ranging from...
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| Hauptverfasser: | , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
American Institute of Physics
2012
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3461015/ https://ncbi.nlm.nih.gov/pubmed/23020378 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4750974 |
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