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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be...
Tallennettuna:
| Päätekijät: | , , , , , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2012
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3458610/ https://ncbi.nlm.nih.gov/pubmed/23019560 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.73 |
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