Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

A synchrotron beam has been used to test the spatial resolution of a single-photon-resolving integrating readout-chip coupled to a 320 µm-thick silicon strip sensor with a dedicated readout system. Charge interpolation methods have yielded a spatial resolution of σ(x) ≃ 1.8 µm for a 20 µm-pitch stri...

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Hlavní autoři: Schubert, A., Bergamaschi, A., David, C., Dinapoli, R., Elbracht-Leong, S., Gorelick, S., Graafsma, H., Henrich, B., Johnson, I., Lohmann, M., Mozzanica, A., Radicci, V., Rassool, R., Schädler, L., Schmitt, B., Shi, X., Sobott, B.
Médium: Artigo
Jazyk:Inglês
Vydáno: International Union of Crystallography 2012
Témata:
Research Papers
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3408957/
https://ncbi.nlm.nih.gov/pubmed/22514170
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S090904951200235X
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