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High-resolution study of (002, 113, 11−1) four-beam diffraction in Si
The results of a high-resolution study of the (002, 113, [Image: see text]) four-beam diffraction in Si are presented. The incident synchrotron radiation beam was highly monochromated and collimated with a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes, in an...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2012
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3329769/ https://ncbi.nlm.nih.gov/pubmed/22514065 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0108767312012305 |
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